Statistical modeling, design, centering, yield optimization and cost-driven design
Statistical modeling, design, centering, yield optimization and cost-driven design
This presentation addresses the challenges of microwave integrated circuit design technology. Included are the following topics: statistical device modeling; device centering; yield optimization; cost-driven design; space mapping optimization; physical device and circuit optimization; electromagnetic optimization; and novel topics in engineering optimization.
Slides for a presentation given on May 19, 1995 at the 1995 IEEE MTT-S International Microwave Symposium, in Orlando, Florida. Bandler presented these slides in the workshop on “CAD design methodology for commercial applications” organized and chaired by Anthony M. Pavio.
- McMaster University Canada
electromagnetic optimization, statistical device modeling, space mapping, device centering, cost-driven design, yield optimization
electromagnetic optimization, statistical device modeling, space mapping, device centering, cost-driven design, yield optimization
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