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image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Digitální knihovna V...arrow_drop_down
image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
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Metoda napěťového kontrastu v ESEM

Authors: Buchta, Michal;

Metoda napěťového kontrastu v ESEM

Abstract

This graduation thesis deals with the problem of voltage contrast in ESEM. The purpose of this work was to verify influence of used detectors in the dependence on conditions in specimen chamber on the size of voltage contrast. With the conditions in specimen chamber we understand pressure and working conditions of signal detection. We used power transistor as specimen.

Tato práce se zabývá problematikou napěťového kontrastu v ESEM. Cílem práce bylo experimentálně ověřit vliv použitých detektorů v závislosti na podmínkách v komoře vzorku na velikost napěťového kontrastu. Podmínkami v komoře vzorku rozumíme tlak a pracovní podmínky detekce signálu.. Jako vzorek byl použit výkonový tranzistor.

C

Country
Czech Republic
Related Organizations
Keywords

scintillation detector., electron microscopy, Voltage contrast, ionizační detektor, scintilační detektor., elektronová mikroskopie, ionization detector, Napěťový kontrast

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