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Automatic test systems for transceivers NG-PON2

Authors: Gonçalves, João Miguel Cardoso;

Automatic test systems for transceivers NG-PON2

Abstract

As comunicações têm vindo a ter um papel fundamental em interligar todas as pessoas do mundo. Mais do que nunca, tem havido uma incessante necessidade de tornar a tecnologia mais ubíqua. Com o recente avanço e desenvolvimento da tecnologia Optica, tem sido possível acompanhar a demanda por altas taxas de transmissão em upstream ou downstream, maior largura de banda e ainda garantir Quality of Service (QoS) entre ínumeros utilizadores, etc. . . Esta necessidade emergente tem levado empresas de telecomunicações a inovar na área de desenvolvimento de equipamento óptico e por consequente, comaltar as necessidades referidas. Para isto acontecer tem de haver um bom controlo, calibração e teste de peças produzidas. O trabalho desta dissertação dedica-se ao melhoramento e acrescento de funcionalidades a uma placa de testes desenhada para desempenhar medições de níveis de Bit Error Ratio (BER), calibração e manutenção de peças para o novo standard óptico (New Gigabit Passive Optical Network 2 (NGPON2)) que recorre ao uso de taxas máximas de transmissão de 10Gb/s por canal Na primeira parte do trabalho é dado foco ao desenvolvimento de um módulo escravo Inter Integrated Circuit (I2C) que visa estabelecer o contacto entre a placa de calibração e o utilizador fornecendo os valores de BER medidos através de um bloco dedicado a medir o nível de BER. Mais tarde este módulo servirá para poder aceder aos micro-circuitos da placa de testes podendo realizar funções de calibração. Numa segunda parte, é realizada uma caracterização de diferentes transceivers de diferentes Field Programmable Gate Array (FPGA)s, a caracterização consiste numa análise do diagram de olho de transceivers e ainda sendo possível, testar o modo contínuo nas mesmas, através curvas de BER para avaliar a sua resposta. Por fim, é feita uma comparação entre os mesmos transceivers, além de que todos os resultados obtidos irão contribuir para a o projecto fonte da placa de testes automatizada desenvolvida pela PICadvanced com o intuito de avaliar a produção de 10 Gigabit Small Form Factor Pluggables (XFP).

Optical communications have had a fundamental role in conecting people worldwide. More than ever, there has been an incessant necessity to turn technology more ubiquitous With recent advancements in optical technology, it has become possible to keep up with the demand for higher transmission rates in upstream or downstream, higher bandwidth e still guaranteeing Quality of Service (QoS) among inumerous users This emerging necessity has taken telecommunication companies to inovate in the area of development regarding optical equipment and also dealing with the referred necessities. For this to happen, good quality control, calibration e testing of produced parts is of paramount importance. The work cut out for this dissertation is focused on the improvement and addition of funtionalities to a test-board designed to perform measurements of BER levels, calibration and maintenance of parts according to the newest optical standard(New Gigabit Passive Optical Network 2 (NGPON2)) that operates in maximum rates of 10Gb/s per channel. In the rst part of this work, emphasis is given to the development of a slave Inter Integrated Circuit (I2C) module that ensures connection between the test board and the user, supplying BER values measured through a block dedicated to measure BER levels. Later the same module will allow to access all micro-controlers of the test-board, ensuring calibration functions. On a second part, a characterization of different transceivers of different Field Programmable Gate Array (FPGA)s is performed, consisting of an eye diagram analysis of the transceivers and if possible, to test 10Gb/s continuous mode through BER curves assessing their response. Finally, a comparison is made between all transceivers, the obtained response along with all the respective results, will contribute to the source project of the automatic test board developed at PICadvanced with the intent on evaluating 10 Gigabit Small Form Factor Pluggables (XFP) production.

Mestrado em Engenharia Eletrónica e Telecomunicações

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Portugal
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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
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