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Método y sistema de testado de circuitos integrados de radiofrecuencia a nivel de oblea y su uso

Authors: Huertas-Díaz, J. L.; Barragán, Manuel J.;

Método y sistema de testado de circuitos integrados de radiofrecuencia a nivel de oblea y su uso

Abstract

El objetivo principal de este invento es proporcionar un sistema y un método fiable y rápido para descartar transceptores integrados defectuosos a nivel de oblea mediante el establecimiento de enlaces inalámbricos entre diferentes circuitos en la oblea, de tal forma que las señales necesarias para testar un determinado transceptor son proporcionadas o leídas por otro de los transceptores de la misma oblea. El sistema emplea para ello, un equipo de test digital de baja frecuencia que al menos comprende dos agujas de test para el envío, recepción y comparación de unas secuencias de datos de test que se intercambian entre el equipo de test y los circuitos integrados de la oblea.

A1 Solicitud de patente con informe sobre el estado de la técnica

Consejo Superior de Investigaciones Científicas (España)

Peer reviewed

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
views
OpenAIRE UsageCountsViews provided by UsageCounts
downloads
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58
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