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doi: 10.5772/7615
handle: 10261/85876
This work is in part supported by the Spanish founded Project: TEC2007-68072/TECATE, "Técnicas para mejorar la calidad del test y las prestaciones del diseño en tecnologías CMOS submicrométreicas".
Peer reviewed
| selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 0 | |
| popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Average | |
| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Average | |
| impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Average |
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