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handle: 10261/51169
[ES] La presente invención se refiere a un procedimiento para recubrir puntas de AFM (Atomic Forcé Microscopy, microscopio de fuerzas atómicas) mediante el depósito de un material en fonna de nanopartículas con una fuente de agregados.
[EN] The present invention relates to a method for covering Atomic Force Microscopy (AFM) tips by depositing a material in the fonn of nanoparticles with an aggregate source.
A1 Solicitud de patente con informe sobre el estado de la técnica
Consejo Superior de Investigaciones Científicas (España)
Peer reviewed
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