A BIST Solution for Frequency Domain Characterization of Analog Circuits

descriptionPublicationkeyboard_double_arrow_right Article 21 May 2010 Spain English Publisher:Springer Science and Business Media LLCJournal:Journal of Electronic Testing, volume 26, pages 429-441 (issn: 0923-8174, eissn: 1573-0727,

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Authors: Manuel J. Barragan Asian; Diego Vázquez; Adoración Rueda;

doi: 10.1007/s10836-010-5158-7

handle: 11441/71350 , 10261/33220

A BIST Solution for Frequency Domain Characterization of Analog Circuits

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Abstract

This work presents an efficient implementation of a BIST solution for frequency characterization of analog systems. It allows a complete characterization in terms of magnitude and phase, including also harmonic distortion and offset measurements. Signal generation is performed using a modified filter, while response evaluation is based on 1storder ÓÄ modulation and very simple digital processing. The signal generator and the response analyzer have been implemented using the Switched-Capacitor (SC) technique in a standard 0.35ìm-3.3V CMOS technology. Both circuits have been separately validated, and an on-board prototype of the complete test system for frequency characterization has been implemented. Experimental results verify the functionality of the proposed approach, and a dynamic range of 70dB@62.5kHz (1MHz clock) has been demonstrated.

Gobierno de España TEC2007-68072/MIC, TSI 020400- 2008-71

Catrene European Project 2A105SR2

Country

Spain

Related Organizations

Spanish National Research Council
Spain
University of Seville
Spain
Seville Institute of Microelectronics
Spain
Centro Nacional de Microelectrónica
Spain
Universidad de Sevilla (US)
Spain

Keywords

Analog BIST, Frequency Response Characterization, On-Chip Spectrum Analyzer, Signal Generator, On-Chip Network Analyzer

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