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Caracterización radiométrica de una cámara CMOS para medidas de reflectancia de materiales translúcidos

Authors: Santafé, Pablo; Ferrero, Alejandro; Campos Acosta, Joaquín;

Caracterización radiométrica de una cámara CMOS para medidas de reflectancia de materiales translúcidos

Abstract

A la hora de realizar medidas con calidad metrológica es muy importante caracterizar to-das las posibles fuentes de ruido, tanto las externas como las intrínsecas al sistema de medida. En este trabajo se han caracterizado las fuentes de ruido intrínsecas a una cámara digital con un sensor CMOS (Hamamatsu ORCA-Flash4.0 V3), la cual va a ser utilizada como sistema de detección en medidas trazables de la función de distribución de espar-cimiento y reflectancia superficial bidireccionales (BSSRDF). Se han estimado el ruido de lectura, el factor de conversión entre cuentas y electrones, la linealidad de la respuesta y la tasa de electrones generados térmicamente en el sensor. Además, se han identificado los píxeles que presentan un comportamiento anómalo.

XII Reunión Española de Optoelectrónica (OPTOEL), evento online, 30 de junio - 2 de julio de 2021. -- https://optoel2021.es/

Keywords

Dark current, Readout noise, Linearity, Bad pixels, CMOS, Irradiance, Matrix detector

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
0
Average
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