Stacking faults are ubiquitous structural defects in YBa2Cu3O7 high-Tc superconductors. Far from being detrimental, the control of the defect landscape, i.e., the length, density, and distribution of YBa2Cu4Oy (Y124) intergrowths, changing the nanostrain of the material can be used to enhance the vortex pinning properties of the superconductor, as required for applications. Recently, the use of advanced scanning transmission electronic microscopy has unveiled the presence of complex point nanodefects (clusters of Cu and O vacancies) within Y124, with an associated magnetic moment predicted by density functional calculations. In this work, we investigate the nature of defect-driven embedded magnetism in YBCO samples (thin films, nanocomposites, and a single crystal) containing different distributions of Y124 intergrowths using X-ray magnetic circular dichroism (XMCD), combined with scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS). The dichroic Cu signal correlates with the density of Y124 intergrowths, demonstrating the defect-driven origin of the embedded magnetism. Remarkably, a Cu XMCD signal is observed even in the single crystal, associated with the small presence of defects at the surface. Our work thus demonstrates the ubiquity of embedded magnetism in YBCO associated with faulted Y124 defects.

We thank G. Nieva from Centro Atómico de Bariloche for YBCO single-crystal supply, and S. Hartman and R. Mishra from Oak Ridge National Laboratory for discussions on DFT simulations. We acknowledge financial support from the Spanish Ministry of Economy and Competitiveness through the “Severo Ochoa” Programme for Centres of Excellence in R&D (Grant SEV-2015-0496), COACHSUPERENERGY (Grant MAT2014-51778-C2-1-R), SUMATE Project RTI2018-095853-B-C21, co-financed by the European Regional Development Fund, COST-Nanohybri CA16218, DWARFS project (Grant MAT2017-83468-R) and Catalan Government with Grant 2017-SGR-1519. The XMCD experiments were performed at the BOREAS beamline of the ALBA Synchrotron Light Facility with the collaboration of ALBA staff. The STEM microscopy work was conducted in “Laboratorio de Microscopias Avanzadas” at the Instituto de Nanociencia de Aragon-Universidad de Zaragoza. We acknowledge the LMA-INA for offering access to their instruments and expertise. STEM-EELS analysis was conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility. J.G. also acknowledges the Ramón y Cajal program (Grant RYC-2012-11709).

Peer reviewed