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doi: 10.1063/1.2121927
handle: 10261/21736
Brillouin spectroscopy has been used to study the effect of the deposition temperature on the surface acoustic wave (SAW) propagation velocity of aluminum nitride (AlN) films. The results show a dependence of the SAW propagation velocity on the growth temperature of AlN films. The highest value of acoustic velocity was obtained for the film elaborated without heating. Structural characterization of the AlN films synthesized at various deposition temperatures was carried out by x-ray diffraction. These analyses pointed out that the deposition temperature influences the standard deviation of (002) AlN film preferred orientation. The growth temperature clearly influences the acoustical and crystalline properties of AlN thin films.
III-V semiconductors, Surface acoustic waves, Brillouin spectra, Wide band gap semiconductors, Aluminium compounds
III-V semiconductors, Surface acoustic waves, Brillouin spectra, Wide band gap semiconductors, Aluminium compounds
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