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handle: 10261/201427
[EN] In this work we demonstrated the necessity to complement the techniques XPS and IGC-IDto evaluate the surface properties of the SiC materials. We have studied four SiC materials with different particles sizes being 3 of them of a Si/C ratio close to the stoichiometrywhereas for the fourth one, this ratio is 0.7, indicating an excess of C in the surface of theparticles. The dispersive energy, ds, of these materials is 77.5, 64.0, 40.5 and 44.5 for the SiCsized 0.7, 1, 7 and 10 m, respectively. The lowest dsvalues are found for the SiC than in XPSpresented an excess of surface carbon. The acid constants kAare close to unity and in thecase of the base constant kB, they are found to be 1.1, 1.0, 0.4 and 1.1 for each above men-tioned particle sized, being again the sample that presented the lowest kBvalue the samplethat presented a particle size of 0.7. The SiC with an excess of surface C presents the lowestkB/kA ratio indicating that most part of the active sites are blocked by carbon atoms.
[ES] En este trabajo se ha mostrado cómo las técnicas XPS e IGC-ID son complementarias a la horade evaluar las propiedades superficiales de partículas de SiC. De los cuatro SiC analizadostres de ellos poseen una relación Si/C próxima a la estequiométrica, mientras que en el otrocaso dicha relación es de 0.7, indicando un exceso en C superficial. La energía dispersivasdde estos materiales presenta valores de 77.5, 64.0, 40.3 y 44.5 para los SiC de 0.7, 1,7 y 10 micrómetros de tama ̃no de partícula, siendo inferior para aquel SiC que por XPSpresenta la relación Si/C de 0.7. Las constantes ácidas kAposeen valores de 1.01, 0.98, 1.10y 1.00, a la vez que las constantes básicas kBson de 1.1, 1.0, 0.4 y 1.1, para los SiC de 0.7, 1,7 y 10 micrómetros, respectivamente. De nuevo se comprueba que el SiC con exceso de Cpresenta un valor más peque ̃no de la relación kB/kAindicando que gran parte de los centrosactivos están bloqueados por carbono.
This work has been financially supported by Spanish Ministry of Economics and Competitiveness (MAT2016-76516-R).Financial support from Fundacion General CSIC (ProgramaComfuturo) is also acknowledged.
TP785-869, Surface properties, XPS, Clay industries. Ceramics. Glass, IGC-IDSiC, Propiedades superficiales
TP785-869, Surface properties, XPS, Clay industries. Ceramics. Glass, IGC-IDSiC, Propiedades superficiales
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