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handle: 10261/183093
The authors would like to acknowledge to Luis Alfredo Rodriguez and Dr Etienne Snoeck for useful discussion about GPA analysis. In addition, the authors acknowledge the Spanish Ministry of Economy and Competitiveness (MAT2010‐15870), as well as the Regional Government of Aragon and the European Social Fund for financial support. The authors would also like to acknowledge Spanish Government (MAT2009‐13569) project for funding. C. C. acknowledges the Ramon y Cajal program (RYC‐2011‐08550).
It′s all your fault! Microporous titanosilicate ETS‐10 crystals have been analyzed by advanced electron microscopy techniques. With the last generation of spherical aberration corrected electron microscopes, truly atomic resolution images have been recorded. Owing to the extremely high‐resolution images that have been obtained, the multiple defects (stacking faults, lack of porosity and “double‐pores”) present in this type of material can be analyzed in great detail.
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Electron microscopy, Molecular sieves, Catalysis
Electron microscopy, Molecular sieves, Catalysis
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