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handle: 10261/176717 , 10261/176708
[ES] Procedimiento de análisis funcional de semiconductores alimentados inalámbricamente. Se describe un procedimiento para analizar semiconductores alimentados inalámbricamente en estado de condiciones de trabajo, es decir el análisis es funcional y permite obtener datos reales del componente en aquellas condiciones en las que será sometido cuando esté funcionando. Se basa en la toma de datos relacionados con las temperaturas que se producen en el semiconductor cuando se encuentra operativo, es decir se toman datos referidos a la hipertermia inducida por el paso de corriente por el semiconductor en funcionamiento. La señal que alimenta el commponente semiconductor se somete, mientras se está alimentando y se están tomando datos de su temperatura, a una serie de modulaciones que generan una serie de efectos en su superficie, nos permite ver reacciones a las modulaciones y obtener datos como fallos o puntos de interés relacionados con el semiconductor mientras se encuentra en funcionamiento.
[EN] The invention relates to a method for analysing wirelessly fed semiconductors under working conditions, i.e. the analysis is functional and allows real data to be obtained from the component under the conditions to which it would be subjected during operation. It is based on the collection of data related to temperatures generated in the semiconductor during the operation thereof, i.e. data are collected which relate to the hyperthermia induced by the flow of current through the semiconductor during the operation thereof. The signal feeding the semiconductor component is subjected, during the feeding of same and the collection of data relating to the temperature thereof, to a series of modulations generating a series of effects on the surface thereof. It allows observation of reactions to the modulations and collection of data on, for example, defects or points of interest relating to the semiconductor while it is in operation.
Consejo Superior de Investigaciones Científicas (España)
B1 Patente sin examen previo
Peer reviewed
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