Improving spatial resolution, data acquisition times and material properties imaging are some long established goals in atomic force microscopy (AFM). Currently, the most promising approaches to reach those goals involve the excitation and detection of several frequencies of the tip’s oscillation. Usually those frequencies are associated with either the higher harmonics of the oscillation or the eigenmodes of the cantilever. Bimodal AFM is an emerging multifrequency technique that is characterized by a high signal-to-noise ratio and the versatility to measure simultaneously different forces. The method is also compatible with molecular resolution imaging under the application of sub-50 pN peak forces.

Conferencia invitada presentada en la 14th International Conference on Noncontact AFM, celebrada en Lindau (Alemania).

Peer Reviewed