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Conference object . 2014 . Peer-reviewed
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Article . 2014 . Peer-reviewed
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Article . 2014 . Peer-reviewed
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SSFB: A highly-efficient and scalable simulation reduction technique for SRAM yield analysis

Authors: Rana, Manish; Canal Corretger, Ramon;

SSFB: A highly-efficient and scalable simulation reduction technique for SRAM yield analysis

Abstract

Estimating extremely low SRAM failure-probabilities by conventional Monte Carlo (MC) approach requires hundreds-of-thousands simulations making it an impractical approach. To alleviate this problem, failure-probability estimation methods with a smaller number of simulations have recently been proposed, most notably variants of consecutive mean-shift based Importance Sampling (IS). In this method, a large amount of time is spent simulating data points that will eventually be discarded in favor of other data-points with minimum norm. This can potentially increase the simulation time by orders of magnitude. To solve this very important limitation, in this paper, we introduce SSFB: A novel SRAM failure-probability estimation method that has much better cognizance of the data points compared to conventional approaches. The proposed method starts with radial simulation of a single point and reduces discarded simulations by: a) random sampling-only-when it reaches a failure boundary and after that continues again with radial simulation of a chosen point, and b) random sampling is performed-only-within a specific failure-range which decreases in each iteration. The proposed method is also scalable to higher dimensions (more input variables) as sampling is done on the surface of the hyper-sphere, rather than within-the-hypersphere as other techniques do. Our results show that using our method we can achieve an overall 40x reduction in simulations compared to consecutive mean-shift IS methods while remaining within the 0.01-Sigma accuracy. © 2014 EDAA.

Peer Reviewed

Country
Spain
Keywords

Probabilities, Failure analysis, Àrees temàtiques de la UPC::Matemàtiques i estadística::Probabilitat, Iterative methods, Integrated circuits, Monte Carlo methods, Integrated circuit yield, Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats, Probabilitats, SRAM chips, Circuits integrats, Probability

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selected citations
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This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
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popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
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