
doi: 10.7498/aps.54.1831
We report the effect of Ru(seed-layer) on the interlayer antiferromagnetic coupling field Hexex, and coercivity Hcc in the Cr/Ru(se ed-layer)/PtCo(thermal stabilizing layer)/Ru(spacer layer)/PtCo(recording layer)/Ru(protective layer) films. Both Hexex and Hcc increase with t he increase o f the thickness of the seed-layer Ru. It arises probably from the appearance of hcp structure in the seed-layer Ru. Hexex and Hcc sh ow a peak value at Ru(seed-layer) layer with a thickness of ~08nm.
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