New generations of Digital Detector Arrays (DDA), integrating, photon counting and energy resolving, enable an extraordinary increase of contrast sensitivity, inspection speed and material discrimination. The increased sensitivity of digital detectors enables the efficient usage for dimensional measurements and functionality tests substituting manual maintenance. X-ray back scatter techniques are applied in applications with single sided access of source and detector. The monitoring of plant growth (Phenotyping) contributes to optimised food supply. New X-ray tube concepts permit the reduction of measurement time in micro-radiography. Phase contrast and dark field imaging provides enhanced structure contrast in micro radiography and micro CT. Computed Laminography (CL) is applied to close the gap between digital radiography and Computed Tomography (CT), especially for mobile 3D applications. Artificial intelligence (AI) is used so solve and speed up complex testing systems and image evaluation. High speed testing systems support car crash tests and battery inspection. Universal robot-based systems are used to optimise processes in the production (4.0).