X-ray imaging is an important tool for non-destructive analysis, providing insights into internal structures without damaging the sample. Traditional X-ray techniques often require high doses of radiation and are not flexible enough, requiring advanced methods that improve resolution while minimizing exposure. This chapter examines state-of-the-art X-ray imaging techniques, including X-ray fluorescence (XRF) for elemental analysis, X-ray diffraction (XRD) and powder X-ray diffraction (PXRD) for crystal structure determination, and X-ray absorption spectroscopy (XAS), single crystal X-ray diffraction (SCXRD), and X-ray emission spectroscopy (XES), and analyzes their applications, limitations and development potential to advance the field and highlight their transformative impact on scientific and industrial fields. Innovative approaches such as flexible detectors and sophisticated data analysis are well on their way to revolutionizing X-ray imaging. Since its introduction in the 1890s, X-ray imaging has been essential in medical diagnostics and industrial inspections. Continuous optimization and innovation are crucial for further progress. Literature reviews and case studies demonstrate the benefits of techniques such as SCXRD and XES for precise structural analysis, while small-angle X-ray scattering (SAXS) provides valuable insights into molecular and material properties. The chapter highlights the critical role of X-ray imaging in various fields, including materials science, chemistry, biology, forensics and quality control. Closing research gaps and promoting continuous innovation improves the understanding and application of X-ray technologies. The future of X-ray imaging promises enormous breakthroughs in numerous disciplines. This chapter highlights the importance of advancing X-ray imaging techniques to address new challenges.