<div class="section abstract"> <div class="htmlview paragraph">This document is an annex to SAE Technical Report SSB-1 (the latest revision).</div> <div class="htmlview paragraph">This document provides reference information and guidance concerning methods used by the semiconductor industry and original equipment manufacturers related to radiation hardness assessments. This document is broken into three primary sections. <span class="xref">Section 3</span> discusses part characterization with focus on selection criteria and acceptance testing. <span class="xref">Section 4</span> discusses design hardening for piece parts with focus on degraded design limits and radiation design margin. The last section, <span class="xref">Section 5</span>, of this report is on hardness assurance inspection and test. This section discusses total ionizing dose, displacement damage and single event effects testing in detail.</div> </div>