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Traps and Charges

descriptionPublicationkeyboard_double_arrow_right Article 01 Feb 2017 English Publisher:ASM InternationalJournal:EDFA Technical Articles, volume 19, pages 10-13 (issn: 1537-0755, Copyright policy )
Authors: David Burgess;

doi: 10.31399/asm.edfa.2017-1.p010

Traps and Charges

Abstract

Abstract This article explains how oxide traps and mobile ions can lead to timing and function failures in ICs and provides insights and advice on how to identify and deal with potential problems.

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Powered by OpenAIRE graph
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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
0
Average
Average
Average
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