The purpose of this work is to investigate and quantify x-ray fluorescence, its production and its spectroscopy. Characteristic x-ray with different energies was obtained from six various elements using Am-241 source with 59.5 keV. It was found that x-ray energy and intensity increase with increasing atomic number of material. X-ray spectroscopy was studied for such elements in respect to their atomic number and intensity of Kα using proportional counter. Furthermore, x-ray fluorescence was produced from different thicknesses of copper foil using different energies. It was found that there is no substantial difference in x-ray fluorescence yield with higher thickness of the target.