
The paper presents SEE rate calculation using different models. It is shown the most conservative estimate for rate prediction is thin layer model. A new approach to set IC’s SEE requirements is suggested. It is based on operational reliability failure probability and SEE failure probability (harsh environment) comparison.
threshold LET and cross section, Information theory, SEE rate calculation, Information technology, Q350-390, single event effects, T58.5-58.64
threshold LET and cross section, Information theory, SEE rate calculation, Information technology, Q350-390, single event effects, T58.5-58.64
| selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 3 | |
| popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Average | |
| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Top 10% | |
| impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Average |
