Archives of Foundry Engineering continues the publishing activity started by Foundry Commission of the Polish Academy of Sciences (PAN) in Katowice in 1978. The initiator of it was the first Chairman Professor Dr Eng. Wacław Sakwa – Corresponding Member of PAN, Honorary Doctor of Czestochowa University of Technology and Silesian University of Technology. This periodical first name was „Solidification of Metals and Alloys” , and made possible to publish the results of works achieved in the field of the Basic Problems Research Cooperation. The subject of publications was related to the title of the periodical and concerned widely understand problems of metals and alloys crystallization in a casting mold. In 1978-2000 the 44 issues have been published. Since 2001 the Foundry Commission has had patronage of the annually published “Archives of Foundry” and since 2007 quarterly published “Archives of Foundry Engineering”. Thematic scope includes scientific issues of foundry industry: Theoretical Aspects of Casting Processes, Innovative Foundry Technologies and Materials, Foundry Processes Computer Aiding, Mechanization, Automation and Robotics in Foundry, Transport Systems in Foundry, Castings Quality Management, Environmental Protection.

Image analysis allows to acquire a number of valuable quantitative informations on the observed structure and make appropriate conclusions. So far, a large part of analyzed images came only from light microscopes, where it was a possibility of accurately distinguish the different phases on the plane. However, the problem happened in the case of the observation of images obtained by scanning electron microscopy. In this case, the presence of various shades of gray, and the spaciousness of the image attained. To perform the analysis the matrix images of the ausferritic ductile iron were used. Full analysis was carried out using the computer program MicroMeter 1.03. Results obtained in the analysis were related directly to the results from X-ray diffraction. Obtained as a result of the analysis were related directly to the results from X-ray diffractometer. The following technique has weaknesses, including the misinterpretation by the operator microscope or program. After all, it was possible to obtain similar results to the result that has been obtained from X-ray diffractometer.