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Turn-by-Turn and Bunch-by-Bunch Transverse Profiles of a Single Bunch in a Full Ring

Authors: Kraus, Richard; University of Nevada, Reno; Fisher, Alan S.;

Turn-by-Turn and Bunch-by-Bunch Transverse Profiles of a Single Bunch in a Full Ring

Abstract

The apparatus described in this paper can image the evolution of the transverse profile of a single bunch, isolated from a full PEP-II ring of 1500 bunches. Using this apparatus there are two methods of single bunch imaging; bunch-by-bunch beam profiling can image every bunch in the ring a single bunch at a time with the images of sequential bunches being in order, allowing one to see variations in beam size along a train. Turn-by-turn beam profiling images a single bunch on each successive turn it makes around the ring. This method will be useful in determining the effect that an injected bunch has on a stable bunch as the oscillations of the injected bunch damp out. Turn-by-turn imaging of the synchrotron light uses a system of lenses and mirrors to image many turns of both the major and minor axis of a single bunch across the photocathode of a gateable camera. The bunch-by-bunch method is simpler: because of a focusing mirror used in porting the light from the ring, the synchrotron light from the orbiting electrons becomes an image at a certain distance from the mirror; and since the camera does not use a lens, the photocathode is setmore » exactly at this image distance. Bunch-by-bunch profiling has shown that in the Low Energy Ring (LER) horizontal bunch size decreases along a train. Turn-by-turn profiling has been able to image 100 turns of a single bunch on one exposure of the camera. The turn-by-turn setup has also been able to image 50 turns of the minor axis showing part of the damping process of an oscillating injected charge during a LER fill. The goal is to image the damping of oscillations of injected charge for 100 turns of both the major and minor axis throughout the damping process during trickle injection. With some changes to the apparatus this goal is within reach and will make turn-by-turn imaging a very useful tool in beam diagnostics.« less

Country
United States
Keywords

43 Particle Accelerators, Mirrors, Oscillations, Accelerators,Other, Photocathodes, Synchrotrons Accelerators,Other, Electrons, Cameras, Damping, Focusing, Lenses

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
0
Average
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