Imaging crystal/spectral line search

descriptionPublicationkeyboard_double_arrow_right Report , Other literature type 16 Feb 1998 United States Publisher:Office of Scientific and Technical Information (OSTI)

Authors: Koch, J.A.;

doi: 10.2172/670066

Imaging crystal/spectral line search

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Abstract

The following table is a compilation of chance coincidences between x- ray line wavelengths and crystal planes which will reflect those wavelengths near normal incidence. The motivation is to explore the possibilities for expanding the range of choices for near normal incidence x-ray crystal imaging.

Country

United States

Related Organizations

University of North Texas
United States

Keywords

Data, Computer Codes, 36 Materials Science, Wavelengths, Images, X Radiation, Crystals

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