Multilayered plating thickness. Final report

descriptionPublicationkeyboard_double_arrow_right Report , Other literature type 01 Aug 1978 United States Publisher:Office of Scientific and Technical Information (OSTI)

Authors: Russell, R. J.;

doi: 10.2172/6664119

Multilayered plating thickness. Final report

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Abstract

A nondestructive technique utilizing the X-ray fluorescence spectrometer has been developed for measuring the thickness of both single and multiple layers of plating. Thickness standards and calibration curves also have been developed to support the measurements. Mathematical models for equating the intensity of the fluorescent radiation to the plating thickness are presented.

Country

United States

Related Organizations

University of North Texas
United States

Keywords

Standards, Design, Spectrometers, Mathematical Models, Thickness Gages, X-Ray Spectrometers, Dimensions, X-Ray Fluorescence Analyzers, Measuring Instruments, Surface Coating 440105* -- Radiation Instrumentation-- Radiometric Instruments-- (-1987), Radiometric Gages, Coatings, Calibration, 46 Instrumentation Related To Nuclear Science And Technology, Plating, Thickness, Deposition, Operation

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