Powered by OpenAIRE graph
Found an issue? Give us feedback
image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao https://doi.org/10.2...arrow_drop_down
image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
addClaim

Facial Precision Tracker: Redefining Attendance Management with MTCNN

Authors: Beaula Pinky; N jeyakkannan; D Shankar; S Vijayalakshmi;

Facial Precision Tracker: Redefining Attendance Management with MTCNN

Abstract

This study introduces an innovative smart attendance management system utilizing the Multi-Task Cascaded Convolutional Networks (MTCNN) algorithm to overcome accuracy and real-time identification limitations prevalent in conventional systems. Traditional attendance systems face challenges in maintaining precision and swift recognition. To tackle these issues, this model integrates the robust MTCNN algorithm, renowned for its precise and rapid face detection and recognition capabilities. By leveraging the multi-stage approach of MTCNN, encompassing face detection, landmark localization, and alignment, this system aims to significantly enhance accuracy while enabling real-time identification. The proposed model's architecture incorporates a high-resolution camera at the entry point, utilizing MTCNN to detect faces, match them against a pre-existing database, and seamlessly mark attendance. The study's focus lies in evaluating the improved accuracy, processing speed, and reliability of the system, affirming its potential to revolutionize attendance management in various domains.

  • BIP!
    Impact byBIP!
    selected citations
    These citations are derived from selected sources.
    This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
    0
    popularity
    This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
    Average
    influence
    This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
    Average
    impulse
    This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
    Average
Powered by OpenAIRE graph
Found an issue? Give us feedback
selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
0
Average
Average
Average
Upload OA version
Are you the author of this publication? Upload your Open Access version to Zenodo!
It’s fast and easy, just two clicks!