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Bonding Analysis of [Au (3.16 nm)/Co (1.5 nm)]x35/Si (100) Multilayer Thin Film

Authors: Bisen, R.; Tripathi, J.; Kumar, D.; Singh, J.; Sharma, A.;

Bonding Analysis of [Au (3.16 nm)/Co (1.5 nm)]x35/Si (100) Multilayer Thin Film

Abstract

Довжини зв'язку та інші локальні структурні параметри плівки [Au (3,16 нм)/Co (1,5 нм)]x35/Si (100) із надтонкими окремими шарами досліджували за допомогою абсорбційної рентгенівської спектроскопії (XAS). Багатошарова структура була синтезована методом електронно-променевого випаровування в умовах надвисокого вакууму. Щоб отримати склад з 20 ваг. % атомів Co в матриці Au, були спеціально обрані товщина та кількість шарів. Для вимірювань XAS використовували край поглинання LIII (11919 еВ) атома Au і край поглинання K (7709 еВ) атома Co. Теоретична модель була створена за допомогою файлу кристалографічної інформації (CIF) обох (Au і Co) атомів, а потім для підгонки та аналізу даних був використаний пакет комп'ютерних програм IFEFFIT. У цьому дослідженні була проаналізована структурна геометрія ближнього порядку окремих шарів, а саме стадія окиснення, інформація про атоми оточення, зсув краю, довжина зв'язку та коефіцієнт Дебая-Уоллера. The bond lengths and other local structure parameters of [Au (3.16 nm)/Co (1.5 nm)]x35/Si (100) having ultra-thin individual layers were investigated using X-ray Absorption Spectroscopy (XAS). The multilayer structure was synthesized by electron beam evaporation method under ultra-high vacuum environment. To make a composition of 20 weight percent (wt. %) of Co atoms in Au matrix, the thickness and number of layers were specifically chosen. For the XAS measurements, LIII-absorption edge (11919 eV) of Au and K-absorption edge (7709 eV) of Co atom were used. A theoretical model was generated by using crystallographic information file (CIF) of both (Au and Co) atoms and then a computer software package IFEFFIT was used for fitting and data analysis. In this study, the short-range order structural geometry of individual layers such as oxidation state, surrounding atomic information, edge shift, bond distance and DebyeWaller factor were analyzed.

Keywords

EXAFS, тонка плівка, thin film, multilayer, багатошаровість, electron beam evaporation, XANES, електронно-променеве випаровування

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
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