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Engineered High-k Oxides

Authors: Weerakkody, DA;

Engineered High-k Oxides

Abstract

The evolution of integrated circuit technology over the five decades resulted in scaling down the minimum feature size of a transistor from 10 μm to ~14 nm. The high-k dielectrics were identified as potential candidates to replace SiO2 from 2007 due to the large leakage current observed when scaling down SiO2. These materials captured the attention of many researchers and led them to focus on many emerging applications in addition to metal oxide semiconductor field effect transistors (MOSFET). In this thesis, two emerging applications of high-k dielectrics were investigated: (i) germanium based MOSFETs and (ii) high frequency high speed rectifiers for optical rectennas.

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    popularity
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    influence
    This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
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    This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
0
Average
Average
Average
Green