
doi: 10.15488/8338
[no abstract]
Mikrobearbeitung, Nahfeld, Werkstück, Nanoprägen, Proximity-Effekt, Kurzwelle, Laser; Werkzeug, Sonde, Photoresist, Dewey Decimal Classification::600 | Technik::620 | Ingenieurwissenschaften und Maschinenbau::621 | Angewandte Physik::621,3 | Elektrotechnik, Elektronik, Strukturierung, Stempel Umformen
Mikrobearbeitung, Nahfeld, Werkstück, Nanoprägen, Proximity-Effekt, Kurzwelle, Laser; Werkzeug, Sonde, Photoresist, Dewey Decimal Classification::600 | Technik::620 | Ingenieurwissenschaften und Maschinenbau::621 | Angewandte Physik::621,3 | Elektrotechnik, Elektronik, Strukturierung, Stempel Umformen
| citations This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 0 | |
| popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Average | |
| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Average | |
| impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Average |
