
doi: 10.14311/512
A technique has been designed for measuring planar components of stray fields from ferromagnetic samples placed in a constant magnetizing field. The technique is based on recording the field of magnetization reversal of a thin magnetic film with the small coercive force being the sensor device of a microwave detector. The possibility of measuring the deformation inhomogeneities caused by mechanical treatment when manufacturing products from ferromagnetic materials is demonstrated. The results of the magnetic measurements agree with the data from X-ray diffraction analysis.
ferromagnetic resonance, microvawe scanning spectrometer, residual stress, thin magnetic films, TA1-2040, Engineering (General). Civil engineering (General)
ferromagnetic resonance, microvawe scanning spectrometer, residual stress, thin magnetic films, TA1-2040, Engineering (General). Civil engineering (General)
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