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Optoelectronic devices and measurement techniques now operate at speeds ranging from picoseconds to hundreds of femtoseconds, have a dynamic range that extends from microvolts to kilovolts, are virtually jitter-free, and can make measurements in a wide variety of circuits, devices, and materials without requiring direct electrical contacts to the samples under test. This tutorial summarizes recent work on this topic emphasizing the basic device and measurement concepts and the diverse uses in electronics, materials science, and communications.
citations This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 21 | |
popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Average | |
influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Top 10% | |
impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Top 10% |