Ellipsometric study of the siliceous films formed on aluminum surfaces by silicate treatment
Shuichi Kawabata; Makoto Takimoto; Kazuo Futami;
Ellipsometric study of the siliceous films formed on aluminum surfaces by silicate treatment
In our previous work, the saturated thickness of siliceous films formed on aluminum surface by silicate treatment was found to be less nms. Variations and the quality of the saturated thickness of the films were investigated by means of ellipsometry for a different molecular weight of silicate ions.
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These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
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This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
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