Name: Refractive Index of Silicon
Creator: W, Primak
Keywords: 0103 physical sciences, 02 engineering and technology, 0210 nano-technology, 01 natural sciences

descriptionPublicationkeyboard_double_arrow_right Article 01 Apr 1971 English Publisher:Optica Publishing GroupJournal:Applied Optics, volume 10, page 759 (issn: 0003-6935, eissn: 1539-4522,

Authors: W, Primak;

doi: 10.1364/ao.10.000759

pmid: 20094537

Refractive Index of Silicon

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Abstract

The refractive index of silicon was measured at room temperature over the range 1.1-2.0 micro by autocollimation in an ~12 degrees wedge. The image was observed by sweeping it across a slit in front of a lead sulfide cell whose output was displayed vertically on an oscilloscope while the sweep frequency was displayed horizontally. The problems of measuring the refractive index of silicon are discussed, and it is concluded that the refractive index is not known absolutely to better than the third decimal.

Related Organizations

Argonne National Laboratory
United States

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