
doi: 10.1255/ejms.1157
pmid: 22274949
Using a simple ion source set-up, laser desorption/ionization on silicon (DIOS) was demonstrated with the use of a custom-made drift tube ion mobility spectrometer (IMS), mounted on a commercial triple quadrupole mass spectrometer, and with an IMS equipped with a Faraday plate detector. DIOS was tested by mobility measurement of tetrapropylammonium iodide, tetrabutylammonium iodide and tetrapentylammonium iodide, whilst 2,6-di- tert-butylpyridine was used as a standard. The reduced mobilities measured for the test halides are in concordance with previously obtained ion mobility spectrometry–mass spectrometry data.
ta213, ta114, Mass spectrometry, Desorption/ionization on silicon (DIOS), Ion mobility spectrometry
ta213, ta114, Mass spectrometry, Desorption/ionization on silicon (DIOS), Ion mobility spectrometry
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