
doi: 10.1155/1998/38280
In this paper a software (MOSOFT) has been developed for 4‐level simulation of MOSFETS. This software simulates the device characteristics up to micron channel length and includes long channel, short channel, subthreshold and field dependent mobility degradation models.
channel effect, MOSOFT, Electrical engineering. Electronics. Nuclear engineering, VGB., TK1-9971
channel effect, MOSOFT, Electrical engineering. Electronics. Nuclear engineering, VGB., TK1-9971
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