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Constant-Phase-Element Behavior Caused by Resistivity Distributions in Films

Authors: B Hirschorn; M E Orazem; B Tribollet; V Vivier; I Frateur; M Musiani;

Constant-Phase-Element Behavior Caused by Resistivity Distributions in Films

Abstract

CPE behavior may be attributed to the distribution of physical properties in films, in the direction normal to the electrode surface. Numerical simulations were used to show that, under assumption that the dielectric constant is independent of position, a normal power-law distribution of local resistivity is consistent with the Constant-Phase Element (CPE). An analytic expression for the impedance corresponding to a power-law distribution of resistivity was developed and used to establish a relationship between parameters for the CPE and physical properties of the film. The resulting impedance response was compared to that obtained from the Young resistivity distribution.

Countries
Italy, France, Italy
Keywords

electric impedance, Constant-phase element, numerical analysis, [CHIM] Chemical Sciences, dielectric thin films, CPE, permittivity, Films, electrical resistivity

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
666
Top 0.1%
Top 1%
Top 1%
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