We propose a methodology for enhancing the diffraction limited spatial resolution attained in Raman and Fourier transform infrared microspectroscopic imaging techniques. Near-field scanning optical microscopy (SNOM) and spectroscopy employ apertureless and aperture approaches to provide ultra-high spatially resolved images at the nanometer level. In contrast, we employ conventional spectral acquisition schemes modified by spatial oversampling with the subsequent application of deconvolution techniques. As an example, this methodology is applied to flat samples using point illumination. Simulated data, assuming idealized sample concentration profiles, are presented together with experimental Raman microspectroscopic data from chemically and morphologically well-defined test samples. Intensity profiles determined using conventional mapping and imaging techniques are compared to those obtained by the probe/deconvolution methodology.