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Elemental analysis with x-ray fluorescence spectrometry

Authors: Peter Lienemann; Davide Bleiner;

Elemental analysis with x-ray fluorescence spectrometry

Abstract

Elemental analysis by means of X-ray fluorescence (XRF) spectrometry is based on the element-specific electromagnetic radiation induced as a consequence of inner-shell ionization. XRF spectrometry is ideal for the direct analysis of solid samples, but can also investigate fluid samples. On one side, these methods allow the rapid qualitative screening of unknown samples, without any particular sample preparation. On the other hand, it is possible to perform the fully automated quantitative analysis of large sample sets. Further figures of merit are the ’standard-less’ analysis of samples in a non-destructive mode, and detection down to 0.01 %. The availability of portable XRF systems 6 is a further advantage for on-site measurements. The fundamentals are discussed to orient the user, and a survey of instrumental capabilities is provided.

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
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Average
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