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IEEE Transactions on Microwave Theory and Techniques
Article . 2010 . Peer-reviewed
License: IEEE Copyright
Data sources: Crossref
image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
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Accurate EM-Based Modeling of Cascode FETs

Authors: D. Resca; J. A. Lonac; CIGNANI, RAFAEL; A. Raffo; SANTARELLI, ALBERTO; G. Vannini; FILICORI, FABIO;

Accurate EM-Based Modeling of Cascode FETs

Abstract

Cascode field-effect transistors (FETs) are widely used in the design of monolithic microwave integrated circuits (MMICs), owing to their almost unilateral and broadband behavior. However, since a dedicated model of the cell is rarely provided by foundries, a suboptimal description built by replicating the standard foundry model for both the common source and common gate device is often adopted. This might limit the success of the MMIC design at the first foundry run. This paper describes an electromagnetic-based empirical model of cascode cells, covering topics from the formulation and identification procedures to the corresponding validation described in an exhaustive experimental section. A MMIC low-noise distributed amplifier case is then presented and the proposed model is used for circuit analysis and instability detection. Clear indication is provided about the improvement in the prediction of critical behaviors with respect to conventional modeling approaches. A cascode cell with a symmetric layout is also successfully modeled.

Country
Italy
Keywords

ELECTROMAGNETIC ANALYSIS (EM); MICROWAVE FIELD EFFECT TRANSISTORS (FETS); MONOLITHIC MICROWAVE INTEGRATED CIRCUITS (MMICS); SEMICONDUCTOR DEVICE MODELING, Electromagnetic (EM) analysis; Microwave field-effect transistors (FETs); Monolithic microwave integrated circuits (MMICs); Semiconductor device modeling;

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    popularity
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    influence
    This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
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    impulse
    This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
    Top 10%
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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
22
Top 10%
Top 10%
Top 10%
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