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image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao IEEE Transactions on...arrow_drop_down
image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
IEEE Transactions on Microwave Theory and Techniques
Article . 1977 . Peer-reviewed
License: IEEE Copyright
Data sources: Crossref
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Dissipation Loss Effects in Isolated and Coupled Transmission Lines

Authors: B.E. Spielman;

Dissipation Loss Effects in Isolated and Coupled Transmission Lines

Abstract

This paper describes a computer-aided analysis of dissipation losses in uniform isolated or coupled transmission lines for microwave and millimeter-wave integrated-circuit applications. The analysis employs a quasi-TEM model for isolated transmission lines and for the even- and odd-mode transmission lines associated with coupled-line structures. The conductor and dielectric losses are then related to equivalent charge density distributions, which are evaluated using a method-of-moments solution. The transmission lines treated by this analysis may contain any number of Iossy conductors and inhomogeneous dielectrics, consisting of any number of different homogeneous dielectric regions. A development is provided to explicitly relate the four-port terminal-electrical performance of directional couplers to evaluated even- and odd- mode loss coefficients. Examples of evaluated losses are presented in graphical form for isolated lines of inverted microstrip and trapped inverted microstrip and edge-coupled microstrip with a dielectric overlay. The analysis accuracy has been confirmed using microstrip and coplanar waveguide configurations. A comparison is made of the total loss characteristics for microstrip, coplanar waveguide, inverted microstrip, and trapped inverted microstrip. Calculations are compared with measurements for the coupled-line structure. Accuracy of the solution and suggested refinements are discussed. Five computer programs are documented.

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
64
Average
Top 1%
Average
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