
The transfer functions of tips with various sharpened tip ends were calculated and the resolution of these tips was esti-mated by considering the resolution limit due to thermal noise at room temperature. The tip having an ellipsoidal tip end (ellipsoidal tip) is found to be a suitable candidate for high-resolution magnetic force microscopy. Sharpening of the flat tip end makes zero signal frequencies disappear for tips with ellipticities larger than tan 45 . The sensitivity shows a maximum around an ellipticity of tan 80 . The ellipsoidal tip shows a much smaller tip thickness dependence compared to the tip having a flat tip end because only the tip end mainly contributes to signals in case of the ellipsoidal tip.
magnetic tips, SMI-EXP: EXPERIMENTAL TECHNIQUES, IR-55851, SMI-TST: From 2006 in EWI-TST, Magnetic force microscopy (MFM), METIS-212076, METIS-212078, EWI-5632, Resolution, TST-MFM: Magnetic Force Microscope, TST-uSPAM: micro Scanning Probe Array Memory, IR-45378, Simulation
magnetic tips, SMI-EXP: EXPERIMENTAL TECHNIQUES, IR-55851, SMI-TST: From 2006 in EWI-TST, Magnetic force microscopy (MFM), METIS-212076, METIS-212078, EWI-5632, Resolution, TST-MFM: Magnetic Force Microscope, TST-uSPAM: micro Scanning Probe Array Memory, IR-45378, Simulation
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