Cost effective manufacturing test using mission mode tests

descriptionPublicationkeyboard_double_arrow_right Article , Conference object 01 Jan 2007Publisher:IEEEJournal:2007 IEEE International Test Conference

Authors: Parmod Aggarwal;

doi: 10.1109/test.2007.4437662

Cost effective manufacturing test using mission mode tests

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Abstract

Mission mode testing, using application level tests on the top of end-customer operating environment, provides a cost effective complement to other tests during manufacturing test of high quality computer systems. It offers unique benefits which are not available with other types of tests. This paper discusses our experience with using Mission Mode tests, their effectiveness and costs, during manufacturing at Sun.

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Fields of Science

engineering and technology

electrical engineering, electronic engineering, information engineering

Fields of Science

engineering and technology

electrical engineering, electronic engineering, information engineering

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