The author discusses about outsourcing analog/mixed-signal DFT. At present we still lack a "SAF" metric for measuring analog IC fault coverage, as most analog faults that are found by testing are of a parametric variety, and can not be measured or scored (as in the SAF coverage grade) by using Boolean techniques. To analyze analog and mixed-signal (A/MS) logic for testability, one has to know what the analog failures are that need to be detected, what the capability of the test equipment will be for these measurements, what the error or repeatability will be, and what the trade off is going to be between increased test accuracy and test time