
Shmoo-plots are a powerful characterization technique in digital IC testing. Utilization and number of ICs exposed are limited by high execution times. This work presents an effective Fast-Shmoo algorithm to accelerate device characterization. The robust optimization concept is adapted to specific device characterization needs and reduce test execution times significantly.
| selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 5 | |
| popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Average | |
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