Is it rocket science?

descriptionPublicationkeyboard_double_arrow_right Article , Conference object 25 Jun 2003Publisher:IEEEJournal:Proceedings. International Test Conference

Authors: Anthony P. Ambler;

doi: 10.1109/test.2002.1041896

Is it rocket science?

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Abstract

Summary form only given. This article gives a general overview of system test. Topics covered include: chip test; board test; integrated system test; high integrity/value systems; field service; diagnostics; false failures; and spares.

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The University of Texas at Austin
United States

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