This paper addresses the problem of testing the LUT/RAM modules of configurable SRAM-based FPGAs using a minimum number of test configurations. A model of architecture for the LUT/RAM module with N inputs and 2/sup N/ memory cells is proposed taking into account the LUT and RAM modes. Concerning the RAM mode, we demonstrate that a unique test configuration is required for a single module. The problem is shown equivalent to the test of a classical SRAM circuit allowing to use existing algorithms such as the march tests. We also propose a unique test configuration called 'pseudo shift register' for mxm arrays of modules. In this configuration, the circuit operates as a shift register and an adapted version of the MATS++ algorithm called 'shifted MATS++' is described. Concerning the LUT mode, we use the concept of non-redundant test that proposes to test in LUT mode the parts of the module not tested in RAM mode. Under this hypothesis, it is demonstrated that the test of a single module as well as the test of an mxm array of modules require only 3 test configurations. Using our solution, the test of a complete array of mxm LUT/RAM modules requires 4 test configurations independently of the size of the array and of the modules.