The paper describes the development, the abilities and the current state of EDIF Test as the upcoming standard for transferring test data. The first version of EDIF Test, which covers cycle-oriented, event-oriented and basic analogue waveforms as well as functional tests will be ready for balloting in autumn this year. Boundary scan information compliant to the IEEE 1149.1 standard will be supported too. This paper outlines the d'evelopment methodology of EDIF Test and gives a short view over the features of EDIF Test as part of the complete EDIF environment. It is completed by an outlook on the next steps which will be performed with respect to the further development of EDIF Test.