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Noise modeling of semiconductor devices

Authors: P.D. Petrova;

Noise modeling of semiconductor devices

Abstract

Small-signal noise models for semiconductor devices, such as diodes, bipolar junction transistors and field effect transistors, have been synthesized in this paper. The modeling has been performed on the basis of mathematical equations. The models take into consideration all kinds of noises: thermal noise, shot noise, and flicker noise. The models have been adapted to SPICE and SPICE compatible program packages, such as electronics workbench and circuit maker. Noise simulation for electronic circuits has been performed. The simulation results validate the model developed.

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
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Average
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