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An efficient scanning pattern for layered manufacturing processes

Authors: Yong Yang; Jerry Y. H. Fuh; Han Tong Loh; Yun Gan Wang;

An efficient scanning pattern for layered manufacturing processes

Abstract

Path generation is an important factor that affects the quality and efficiency of most layered manufacturing processes such as SLS, SLA and FDM. This paper introduces an efficient path generation algorithm. The principle of the algorithm and the implementation are presented. A comparative study is used to analyze the effectiveness of this method. The results of comparison on both the path length and processing time between the traditional method and the proposed method are discussed.

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Powered by OpenAIRE graph
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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
3
Average
Average
Average
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